Spring Test Probe Conical Head PA100-E Pogo Pin

PA100-E gold-plated Spring Test Needle Test Pin, Cone-shaped head test pin PA100-E Pogo Pin 

The PA100-E is a spring-loaded test probe designed for in-circuit testing (ICT) and functional circuit testing (FCT) of printed circuit boards (PCBs). Also known as a "pogo pin," it is a common component in electronic manufacturing and testing.

Specifications

• Probe type: ICT test probe.
• Tip shape: Cone.
• Material:
  • Plunger/Needle: Heat-treated beryllium copper (BeCu).
  • Barrel: Brass.
  • Spring: Music wire.
• Plating: Gold.
• Dimensions:
  • Total length: 33.35mm.
  • Needle tube (barrel) diameter: 1.36mm.
  • Needle bar diameter: 0.99mm.
  • Tip diameter: 1.5mm