Gold Plated Spring Test Probe PA160-B1 Pogo Pin P160-B ICT PCB Test Pin Test Tool

The PA160-B1 is a gold-plated spring test probe, or pogo pin, designed for in-circuit testing (ICT) of printed circuit boards (PCBs) and other electronics. Its pointed tip is made to contact solder joints, test pads, and component leads.

• Model number: PA160-B1
• Total length: 24.5 mm
• Barrel diameter: 1.36 mm
• Tip style: Pointed tip
• Tip diameter: 0.99 mm
• Tip material: Brass/Copper, gold plated
• Working stroke: 4 mm
• Spring force at working stroke: 180g (standard)
• Drilling size (for receptacle): 1.7 mm
• Minimum grid/pitch: 2.54 mm
• Current load capacity: 2A
• Contact resistance: 50 mOhm

• Gold plating: Enhances conductivity and resistance to corrosion, which improves reliability and lifespan.
• ICT testing: The PA160-B1 is used for automated testing of populated PCBs in a test station or fixture.
• Matching receptacles: The probe is typically inserted into a matching receptacle (such as an R160 series) that is mounted to the test fixture. This design allows for easy replacement of individual probes that become worn or damaged.
• Contaminated surfaces: The sharp pointed tip is suitable for breaking through flux or other contaminants on test points to ensure a good electrical connection.