Spring Test Probe PAL50-B1 Spear-shaped Tip Pogo Pin Gold Plated

Test Tool PAL50-B1 Spring Test Pin Gold Plated Needle

The PAL50-B1 pogo pin is a spring-loaded test probe used for making temporary electrical connections, often for testing printed circuit boards (PCBs). The "B1" designation refers to its spear-shaped tip, which is designed to puncture or connect with solder joints and test pads, even if contaminated.

Specifications

• Total Length: 27.8mm
• Tip Diameter: 0.48 mm
• Barrel Diameter: 0.68 mm