Gold Plated Spring Test Probe PAL50-Q1 Four-jaw Tip Pogo Pin

PAL50-Q1 four-point crown tip Plum Blossom Spring Test Pin 

The PAL50-Q1 pogo pin is a spring-loaded test probe widely used for testing printed circuit boards (PCBs) and in test jigs for applications requiring temporary electrical connections. It features a distinctive four-point crown tip for reliable contact. 

Specifications

• Model: PAL50-Q1.
• Tip type: 4-point crown, also known as "four claws". This tip design is suitable for contacting component leads and solder joints.
• Needle diameter (tip dia): 0.48mm to 0.50mm.
• Needle sleeve diameter (outer barrel dia): 0.68mm.
• Total length: 16.35mm to 16.55mm.
• Rated current: 3A.
• Full stroke: 2.65mm.
• Material: Gold-plated copper, beryllium copper.