Gold Plated Spring test probe PAL75-B1 Test Pin Pogo Pin

Spring test probe PAL75-B1 Spring Loaded Test Probe 33.35mm diameter 1.02mm needle tip Ø 0.74mm Pogo Pin PL75-B PL75-B1

The PAL75-B1 pogo pin is a spring-loaded probe used for creating temporary electrical connections, particularly for testing printed circuit boards (PCBs) and other electronics. 

• Model Name: PAL75-B1
• Head Type: Conical head or flexible needle point
• Total Length: 33.35mm
• Needle Diameter: 1.02 mm
• Shank Diameter: 0.74 mm
• Current Rating: 3A
  

• Testing Jigs: Used to create temporary electrical connections for programming and testing PCBs without permanent soldering.
• In-Circuit Testing: Probing for testing components on printed circuit assemblies.
• Charging and Connection: Can be used in consumer electronics for charging batteries and board-to-board connections.