Gold Plated Spring Test Probe PAL75-J1 Pogo Pin

Gold Plated Pogo Pin PAL75-J1 Spring Test Probe Round Head 0.76 Dia 1.02mm Pin Length 33.35mm for Testing, PAL75-J1 Test Pin PL75-J ICT FCT PCB Test Tool ...

The PAL75-J1 pogo pin is a spring test probe used for establishing a temporary electrical connection in printed circuit board (PCB) testing.

Key specifications

• Head/Tip type: Spherical (full radius)
• Rated current: 3A
• Current resistance: 50 mΩ
• Full stroke: 2.50mm
• Barrel diameter: 1.02mm
• Tip diameter: 0.74mm
• Total length: 33.35mm
• Materials: Gold-plated barrel and beryllium copper plunger

• Conductive testing: Used for checking the electrical stability and durability of circuit boards.
• ICT/FCT testing: Commonly employed in In-Circuit Test (ICT) and Functional Circuit Test (FCT) jigs to verify PCB functionality.
• Component access: Can access and test lands, pads, and leads on a circuit board.
• Automated PCB inspection: The spring-loaded design allows for automated testing cycles, compensating for surface irregularities.
• Test station maintenance: The removable pin and receptacle design simplifies maintenance by allowing for quick pin replacement in a test station.