Spring test probe crowns tip PAL75-Q1 test pin pogo pin

Gold Plated Crown Tip Spring test probe PL75-Q1 PL75-Q ICT FCT PCB Test Tool Pogo Pin 0.74mm 1.02mm 33.35mm gold needle crowns tip

The PAL75-Q1 is a specific model of a spring-loaded test probe, or pogo pin, used for making temporary electrical connections during the testing of printed circuit boards (PCBs). Its name indicates the series (PAL75 or PL75), and the "Q1" specifies the tip type.

• Tip type: The Q1 model features a four-point crown tip with a diameter of 1.3mm. This tip is designed to reliably make contact with component feet, solder joints, and test pads.
• Tip size: The tip diameter is 1.3mm, while the receptacle sleeve diameter is 1.02mm.
• Total length: 33.35mm.
• Stroke: The pin has a working stroke of 2.5mm.
• Current rating: 3A.
• Materials: The pins are typically made of phosphor brass with a gold-plated finish to ensure good contact and resist corrosion.
• Spring force: The standard spring force is often 100g but can be customized with options ranging from 40g to 220g for different testing applications.
• Receptacle: The PAL75-Q1 probe is designed for use with a matching receptacle (such as R75 series) that is permanently mounted to a test fixture. This allows the spring-loaded pin to be replaced easily if it becomes worn or damaged, without having to resolder the wiring.