Gold plated Spring Test Probe PAL75-Q2 Pogo Pin 

Pogo Pin PAL75-Q2 Gold plated Four Claw Plum Blossom Spring Test Probe outer diameter of 1.02mm, PAL75-Q2 1.0mm Dia 33.4mm Length Metal Spring Test Probe

The PAL75-Q2 pogo pin is a spring-loaded test probe used for making temporary electrical connections, most often for testing printed circuit boards (PCBs). This specific model is identified by its total length, diameter, and tip style.

• Needle sleeve diameter: 1.02 mm.
• Total needle length: 33.35 mm.
• Needle tip style: Crown head, also known as a "4-claw head".
• Current rating: 3A .
• Current resistance: 50mΩ .
• Plunger material: Heat-treated beryllium copper.
• Barrel material: Phosphor bronze, gold-plated.
• Spring material: Gold-plated music wire.

• In-Circuit Testing (ICT): Used to verify the functionality of individual components on a PCB after assembly.
• Functional Testing (FCT): Used to check that the entire assembly functions as intended in its final application.
• Programming jigs: For programming microcontrollers and other components on a board without the need for permanent connectors.
• General-purpose electrical connections: Creating temporary, reliable, and momentary contacts for various test and measurement applications.

• PAL75-Q2: The version with a crown tip and a length of 33.35mm.
• P75-Q2: An alternative series with a crown tip but a shorter length of 16.54mm.

The "Q2" designation typically refers to the crown-shaped tip, which is designed to make a reliable connection on flat pads or through-hole pins.