Gold Plated Spring Test Probe PAM75-J1 Pogo Pin P75-J1

PAM75-J1 Gold-plated Testing Pin Length 27.5mm Dia 1.02mm, PAM75-J1 0.75mm semi-circular head spring needle, PAM75-J1 gold-plated round ball head spring needle 

The PAM75-J1 is a spring-loaded test probe, also known as a "pogo pin," used for creating temporary electrical connections in circuit board testing. It is part of the P75 series of probes and is designed for applications requiring consistent and reliable contact. 

• Probe diameter: 1.02 mm
• Full stroke (travel distance): 2.54 mm
• Spring pressure: 100 grams
• Current rating: 3 A
• Materials:
  • Plunger: Heat-treated beryllium copper gold plated
  • Barrel: Phosphor brass, gold plated
  • Spring: Music wire, gold plated
• Tip: Spherical ("J1") tip
• Typical use: The spherical tip is versatile and can be used to make contact with test pads or component leads on a Printed Circuit Board (PCB).